Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors

Keven Feng, Sandeep Vora, Rui Jiang, Elyse Rosenbaum, Shobha Vasudevan. Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 156-161, IEEE, 2019. [doi]

Abstract

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