François-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh. How Many Test Patterns are Useless?. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 23-28, IEEE Computer Society, 2008. [doi]
Abstract is missing.