José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João C. Teixeira. Probabilistic Testability Analysis and DFT Methods at RTL. In Matteo Sonza Reorda, Ondrej Novák, Bernd Straube, Hana Kubatova, Zdenek Kotásek, Pavel Kubalík, Raimund Ubar, Jiri Bucek, editors, Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006. pages 216-217, IEEE Computer Society, 2006.
Abstract is missing.