DFT and Probabilistic Testability Analysis at RTL - researchr publication authors

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José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João C. Teixeira. DFT and Probabilistic Testability Analysis at RTL. In Eleventh Annual IEEE International High-Level Design Validation and Test Workshop 2006, Monterey, CA, USA, Nov 9-10, 2006. pages 41-47, IEEE Computer Society, 2006. [doi]

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