José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João C. Teixeira. DFT and Probabilistic Testability Analysis at RTL. In Eleventh Annual IEEE International High-Level Design Validation and Test Workshop 2006, Monterey, CA, USA, Nov 9-10, 2006. pages 41-47, IEEE Computer Society, 2006. [doi]
@inproceedings{FernandesSOT06-0,
title = {DFT and Probabilistic Testability Analysis at RTL},
author = {José M. Fernandes and Marcelino B. Santos and Arlindo L. Oliveira and João C. Teixeira},
year = {2006},
doi = {10.1109/HLDVT.2006.320002},
url = {http://doi.ieeecomputersociety.org/10.1109/HLDVT.2006.320002},
researchr = {https://researchr.org/publication/FernandesSOT06-0},
cites = {0},
citedby = {0},
pages = {41-47},
booktitle = {Eleventh Annual IEEE International High-Level Design Validation and Test Workshop 2006, Monterey, CA, USA, Nov 9-10, 2006},
publisher = {IEEE Computer Society},
isbn = {1-4244-0679-X},
}