DFT and Probabilistic Testability Analysis at RTL

José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João C. Teixeira. DFT and Probabilistic Testability Analysis at RTL. In Eleventh Annual IEEE International High-Level Design Validation and Test Workshop 2006, Monterey, CA, USA, Nov 9-10, 2006. pages 41-47, IEEE Computer Society, 2006. [doi]

Abstract

Abstract is missing.