A. Ferrara, P. G. Steeneken, B. K. Boksteen, Anco Heringa, A. J. Scholten, J. Schmitz, Raymond J. E. Hueting. Identifying failure mechanisms in LDMOS transistors by analytical stability analysis. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 321-324, IEEE, 2014. [doi]
Abstract is missing.