Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits

Állan G. Ferreira, Lucas B. Zilch, Vinícius Navarro, Marcelo Soares Lubaszewski, Tiago R. Balen. Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. In 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, SBCCI 2023, Rio de Janeiro, Brazil, August 28 - Sept. 1, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

Abstract is missing.