C. Ferrer, D. Dateo, J. Oliver, Antonio Rubio, M. Rullán. An Approach to the Development of a IDDQ Testable Cell Library. In The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings. pages 46-54, IEEE Computer Society, 1994.
Abstract is missing.