Carles Ferrer, Joan Oliver, Elena Valderrama. A new switch-level test pattern generation algorithm based on single path over a graph representation. In Gordon Adshead, Jochen A. G. Jess, editors, European Design Automation Conference, EURO-DAC 1990, Glasgow, Scotland, UK, March 12-15, 1990. pages 402-406, IEEE Computer Society, 1990. [doi]
Abstract is missing.