Comparative study of usefulness of FeFET, FTJ and ReRAM technology for ternary arithmetic

Dietmar Fey, John Reuben, Stefan Slesazeck. Comparative study of usefulness of FeFET, FTJ and ReRAM technology for ternary arithmetic. In 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021, Dubai, United Arab Emirates, November 28 - Dec. 1, 2021. pages 1-6, IEEE, 2021. [doi]

Abstract

Abstract is missing.