Christian Fibich, Martin Horauer, Roman Obermaisser. Characterization of Interconnect Fault Effects in SRAM-based FPGAs. In Maksim Jenihhin, Hana Kubátová, Nele Metens, Jaan Raik, Foisal Ahmed, Jan Belohoubek, editors, 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023. pages 65-68, IEEE, 2023. [doi]
Abstract is missing.