Ruggedness of 1200 V SiC MPS diodes

Susanne Fichtner, Sophia Frankeser, Josef Lutz, R. Rupp, T. Basler, R. Gerlach. Ruggedness of 1200 V SiC MPS diodes. Microelectronics Reliability, 55(9-10):1677-1681, 2015. [doi]

Abstract

Abstract is missing.