Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre. In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 646-649, IEEE, 2022. [doi]
Abstract is missing.