Farshad Firouzi, Mostafa E. Salehi, Fan Wang, Sied Mehdi Fakhraie, Saeed Safari. Reliability-Aware Dynamic Voltage and Frequency Scaling. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2010, 5-7 July 2010, Lixouri Kefalonia, Greece. pages 304-309, IEEE Computer Society, 2010. [doi]
Abstract is missing.