Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori. Re-using BIST for circuit aging monitoring. In 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015. pages 1-2, IEEE, 2015. [doi]
Abstract is missing.