Yassine Fkih, Pascal Vivet, Bruno Rouzeyre, Marie-Lise Flottes, Giorgio Di Natale, Juergen Schloeffel. 2D to 3D Test Pattern Retargeting Using IEEE P1687 Based 3D DFT Architectures. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014. pages 386-391, IEEE, 2014. [doi]
Abstract is missing.