Design for Testability of a Modular, Mixed Signal Family of VLSI Devices - researchr publication authors

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Ed Flaherty, Andrew Allen, John Morris. Design for Testability of a Modular, Mixed Signal Family of VLSI Devices. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 797-804, IEEE Computer Society, 1993.

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