Ed Flaherty, Andrew Allen, John Morris. Design for Testability of a Modular, Mixed Signal Family of VLSI Devices. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 797-804, IEEE Computer Society, 1993.
@inproceedings{FlahertyAM93,
title = {Design for Testability of a Modular, Mixed Signal Family of VLSI Devices},
author = {Ed Flaherty and Andrew Allen and John Morris},
year = {1993},
tags = {testing, design},
researchr = {https://researchr.org/publication/FlahertyAM93},
cites = {0},
citedby = {0},
pages = {797-804},
booktitle = {Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993},
publisher = {IEEE Computer Society},
isbn = {0-7803-1430-1},
}