Edward Flanigan, Spyros Tragoudas, Arkan Abdulrahman. Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 140-145, IEEE Computer Society, 2009. [doi]
@inproceedings{FlaniganTA09,
title = {Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions},
author = {Edward Flanigan and Spyros Tragoudas and Arkan Abdulrahman},
year = {2009},
doi = {10.1109/VTS.2009.22},
url = {http://dx.doi.org/10.1109/VTS.2009.22},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/FlaniganTA09},
cites = {0},
citedby = {0},
pages = {140-145},
booktitle = {27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3598-2},
}