Simulation Pattern Capturing System for Design Verification Using a Dynamic High Speed Functional Tester (DHSFT)

David Florcik, David Low. Simulation Pattern Capturing System for Design Verification Using a Dynamic High Speed Functional Tester (DHSFT). In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 122-128, IEEE Computer Society, 1983.

Authors

David Florcik

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David Low

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