David Florcik, David Low. Simulation Pattern Capturing System for Design Verification Using a Dynamic High Speed Functional Tester (DHSFT). In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 122-128, IEEE Computer Society, 1983.
@inproceedings{FlorcikL83,
title = {Simulation Pattern Capturing System for Design Verification Using a Dynamic High Speed Functional Tester (DHSFT)},
author = {David Florcik and David Low},
year = {1983},
tags = {design},
researchr = {https://researchr.org/publication/FlorcikL83},
cites = {0},
citedby = {0},
pages = {122-128},
booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983},
publisher = {IEEE Computer Society},
}