Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications - researchr publication authors

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J. L. Fock-Sui-Too, B. Chauchat, P. Austin, P. Tounsi, Michel Mermet-Guyennet, R. Meuret. Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications. Microelectronics Reliability, 48(8-9):1453-1458, 2008. [doi]

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