Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications

J. L. Fock-Sui-Too, B. Chauchat, P. Austin, P. Tounsi, Michel Mermet-Guyennet, R. Meuret. Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications. Microelectronics Reliability, 48(8-9):1453-1458, 2008. [doi]

Abstract

Abstract is missing.