J. L. Fock-Sui-Too, B. Chauchat, P. Austin, P. Tounsi, Michel Mermet-Guyennet, R. Meuret. Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications. Microelectronics Reliability, 48(8-9):1453-1458, 2008. [doi]
@article{Fock-Sui-TooCATMM08,
title = {Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications},
author = {J. L. Fock-Sui-Too and B. Chauchat and P. Austin and P. Tounsi and Michel Mermet-Guyennet and R. Meuret},
year = {2008},
doi = {10.1016/j.microrel.2008.07.051},
url = {http://dx.doi.org/10.1016/j.microrel.2008.07.051},
tags = {testing, reliability},
researchr = {https://researchr.org/publication/Fock-Sui-TooCATMM08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1453-1458},
}