L. M. Fok, Y. H. Liu, W. J. Li. Fabrication and Characterization of nanowires by Atomic Force Microscope Lithography. In 2006 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2006, October 9-15, 2006, Beijing, China. pages 1927-1932, IEEE, 2006. [doi]
@inproceedings{FokLL06, title = {Fabrication and Characterization of nanowires by Atomic Force Microscope Lithography}, author = {L. M. Fok and Y. H. Liu and W. J. Li}, year = {2006}, doi = {10.1109/IROS.2006.282320}, url = {http://dx.doi.org/10.1109/IROS.2006.282320}, researchr = {https://researchr.org/publication/FokLL06}, cites = {0}, citedby = {0}, pages = {1927-1932}, booktitle = {2006 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2006, October 9-15, 2006, Beijing, China}, publisher = {IEEE}, }