Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko. Testing the 400-MHz IBM Generation-4 CMOS Chip. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 106-114, IEEE Computer Society, 1997.
Abstract is missing.