Freddy Forero, Hector Villacorta, Michel Renovell, Víctor H. Champac. Modeling and Detectability of Full Open Gate Defects in FinFET Technology. IEEE Trans. VLSI Syst., 27(9):2180-2190, 2019. [doi]
@article{ForeroVRC19,
title = {Modeling and Detectability of Full Open Gate Defects in FinFET Technology},
author = {Freddy Forero and Hector Villacorta and Michel Renovell and Víctor H. Champac},
year = {2019},
doi = {10.1109/TVLSI.2019.2918768},
url = {https://doi.org/10.1109/TVLSI.2019.2918768},
researchr = {https://researchr.org/publication/ForeroVRC19},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {27},
number = {9},
pages = {2180-2190},
}