The following publications are possibly variants of this publication:
- B-open Defect: A Novel Defect Model in FinFET TechnologyFreddy Forero, Víctor H. Champac, Michel Renovell. jetc, 19(1), January 2023. [doi]
- Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cellsZ. Perez, Javier Mesalles, Hector Villacorta, Fabian Vargas, Víctor H. Champac. latw 2020: 1-6 [doi]
- Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM CellVíctor H. Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas 0001. et, 37(3):369-382, 2021. [doi]
- Behavior and test of open-gate defects in FinFET based cellsFrancisco Mesalles, Hector Villacorta, Michel Renovell, Víctor H. Champac. ets 2016: 1-6 [doi]