Reliability limits of TMR implemented in a SRAM-based FPGA: Heavy ion measures vs. fault injection predictions - researchr publication

researchr

You are not signed in
Sign in
Sign up

Gilles Foucard, Paul Peronnard, Raoul Velazco. Reliability limits of TMR implemented in a SRAM-based FPGA: Heavy ion measures vs. fault injection predictions. In 11th Latin American Test Workshop, LATW 2010, Punta del Este, Uruguay, March 28-30, 2010. pages 1-5, IEEE, 2010. [doi]

Abstract is missing.

runs on WebDSL