Table of Contents

• Reliability analysis of small delay defects in vias located in signal pathsHector Villacorta, Víctor H. Champac, Chuck Hawkins, Jaume Segura 0001. 1-6 [doi]
• RF and Microwave production test requirements for advanced mixed-signal devicesMohamed Mabrouk. 1-4 [doi]
• On Comparing and Complementing two MBT approachesMaximiliano Cristiá, Valdivino Alexandre de Santiago Jr., Nandamudi L. Vijaykumar. 1-6 [doi]
• Embedded test and control of analogue/RF circuits using intelligent resourcesEmmanuel Simeu. 1-2 [doi]
• Automatic generation of a parameter-domain-based functional input coverage modelCarlos Ivan Castro Marquez, Marius Strum, Wang Jiang Chau. 1-6 [doi]
• The limitations of software signature and basic block sizing in soft error fault coverageJosé Rodrigo Azambuja, Fernando Sousa, Lucas Rosa, Fernanda Lima Kastensmidt. 1-8 [doi]
• Reliability limits of TMR implemented in a SRAM-based FPGA: Heavy ion measures vs. fault injection predictionsGilles Foucard, Paul Peronnard, Raoul Velazco. 1-5 [doi]
• Automated test-bed for analog to digital convertersJosé Erick de Souza Lima, Carlos A. dos Reis Filho. 1-5 [doi]
• Evaluation of a new low cost software level fault tolerance technique to cope with soft errorsJimmy Tarrillo, Carlos Arthur Lang Lisbôa, Luigi Carro, Costas Argyrides, Dhiraj K. Pradhan. 1-3 [doi]
• Concurrent test of Network-on-Chip interconnects and routersMarcos Hervé, Pedro Almeida, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski. 1-6 [doi]
• Dependability evaluation of distributed systems through partitioning fault injectionGustavo M. Oliveira, Sérgio Luis Cechin, Taisy Silva Weber. 1-6 [doi]
• - layer thickness and light wavelengthAriel P. Cédola, Marcelo A. Cappelletti, Eitel L. Peltzer y Blancá. 1-4 [doi]
• Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processingMuhammad Mudassar Nisar, Jayaram Natarajan, Abhijit Chatterjee. 1-6 [doi]
• On improving real-time observability for in-system post-silicon debugNicola Nicolici. 1 [doi]
• Manufacturers to end-users tools for radiations induced reliability issues in electronic devicesFrédéric Wrobel. 1 [doi]
• Functional test generation for DMA controllersMichelangelo Grosso, Wilson J. Pérez H., Danilo Ravotto, Ernesto Sánchez 0001, Matteo Sonza Reorda, Jaime Velasco-Medina. 1-6 [doi]
• Performance evaluation model for test processMarcelo Marinho, Paulo Maciel 0001, Erica Sousa, Teresa Maciel, Ermeson C. Andrade. 1-6 [doi]
• Mutation analysis with high-level decision diagramsHanno Hantson, Jaan Raik, Maksim Jenihhin, Anton Chepurov, Raimund Ubar, Giuseppe Di Guglielmo, Franco Fummi. 1-6 [doi]
• Reliability of on-board computer for ITASAT university satelliteEdson Vinci, Osamu Saotome. 1-3 [doi]
• Reliability and safety of medical equipment by use of calibration and certification instrumentsGuillermo Avendaño, Pablo Fuentes 0002, Víctor Castillo, Constanza Garcia, Natalie Dominguez. 1-4 [doi]
• Diversity TMR: Proof of concept in a mixed-signal caseGabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski. 1-6 [doi]
• Heterogeneous integration: Beyond CMOS - coping with variability at the end of the CMOS roadmapSergio Bampi. 1 [doi]
• Dependability validation of a cryptoprocessor to SEU effectsVladimir Trujillo-Olaya, John M. Espinosa-Duran, Jaime Velasco-Medina, Raoul Velazco. 1-6 [doi]
• Variability-aware physical design techniquesGustavo Wilke, Ricardo Reis 0001. 1 [doi]
• Performance testing of distributed block-oriented storage over IP networksPedro Martinez-Julia, Antonio Fernandez Gómez-Skarmeta. 1-4 [doi]
• An evaluation of free/open source static analysis tools applied to embedded softwareLucas Torri, Guilherme Fachini, Leonardo Steinfeld, Vesmar Camara, Luigi Carro, Érika F. Cota. 1-6 [doi]
• ICs and MEMS for energy managementBernard Courtois. 1 [doi]
• Emulating an Agilent™ 4142 on a Keithley™ 2600 series Source Measurement UnitJorge Moreno, Osvaldo González, Rafael Vega, Rogelio Palomera, Manuel Jiménez. 1-3 [doi]
• Procedures and lab setup developed to test MIFARE based transportation devices complianceFiorella Haim, Andrés Bergeret, Alejandra González, Ignacio Benavente. 1-5 [doi]
• Bit-flip injection strategies for FSMs modeled in VHDL behavioral levelJohn M. Espinosa-Duran, Vladimir Trujillo-Olaya, Jaime Velasco-Medina, Raoul Velazco. 1-5 [doi]
• Towards a transmission power self-optimization in reliable Wireless Sensor NetworksFelipe Lavratti, Alex R. Pinto, Dárcio Prestes, Letícia Maria Veiras Bolzani, Fabian Vargas 0001, Carlos Montez. 1-3 [doi]
• Fault prediction in electrical valves using temporal Kohonen mapsLuiz Fernando Gonçalves, Eduardo Luis Schneider, Renato Ventura Bayan Henriques, Marcelo Lubaszewski, Jefferson Luiz Bosa, Paulo Martins Engel. 1-6 [doi]
• Experimental dependability assessment using a faultload specification toolRuthiano S. Munaretti, Bruno Coswig Fiss, Taisy Silva Weber, Sérgio Luis Cechin. 1-6 [doi]
• BICS-based March test for resistive-open defect detection in SRAMsRaul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas 0001. 1-6 [doi]
• Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channelsNicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir. 1-7 [doi]
• Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterizationAlfredo Olmos, Andre Vilas Boas, Eduardo Ribeiro da Silva, José Carlos da Silva 0002, Ricardo Maltione. 1-3 [doi]
• An algorithm for diagnostic fault simulationYu Zhang, Vishwani D. Agrawal. 1-5 [doi]