Hector Villacorta, Víctor H. Champac, Chuck Hawkins, Jaume Segura 0001. Reliability analysis of small delay defects in vias located in signal paths. In 11th Latin American Test Workshop, LATW 2010, Punta del Este, Uruguay, March 28-30, 2010. pages 1-6, IEEE, 2010. [doi]
Abstract is missing.