Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions

Gilles Foucard, Paul Peronnard, Raoul Velazco. Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions. J. Electronic Testing, 27(5):627-633, 2011. [doi]

Abstract

Abstract is missing.