Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Piero Franco, Edward J. McCluskey. Three-pattern tests for delay faults. In 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA. pages 452-456, IEEE Computer Society, 1994. [doi]
Abstract is missing.