Signal probability for reliability evaluation of logic circuits

Denis Teixeira Franco, Maí Correia Vasconcelos, Lirida A. B. Naviner, Jean-François Naviner. Signal probability for reliability evaluation of logic circuits. Microelectronics Reliability, 48(8-9):1586-1591, 2008. [doi]

Authors

Denis Teixeira Franco

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Maí Correia Vasconcelos

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Lirida A. B. Naviner

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Jean-François Naviner

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