Denis Teixeira Franco, Maí Correia Vasconcelos, Lirida A. B. Naviner, Jean-François Naviner. Signal probability for reliability evaluation of logic circuits. Microelectronics Reliability, 48(8-9):1586-1591, 2008. [doi]
@article{FrancoVNN08,
title = {Signal probability for reliability evaluation of logic circuits},
author = {Denis Teixeira Franco and Maí Correia Vasconcelos and Lirida A. B. Naviner and Jean-François Naviner},
year = {2008},
doi = {10.1016/j.microrel.2008.07.002},
url = {http://dx.doi.org/10.1016/j.microrel.2008.07.002},
tags = {logic, reliability},
researchr = {https://researchr.org/publication/FrancoVNN08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1586-1591},
}