Manoj Franklin, Kewal K. Saluja, Kozo Kinoshita. Row/column pattern sensitive fault detection in RAMs via built-in self-test. In Proceedings of the Nineteenth International Symposium on Fault-Tolerant Computing, FTCS 1989, Chicago, IL, USA, 21-23 June, 1989. pages 36-43, IEEE Computer Society, 1989. [doi]
Abstract is missing.