Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

A. Frisch, Mitch Aigner, T. Almy, Hans J. Greub, M. Hazra, S. Mohr, Nicholas J. Naclerio, W. Russell, M. Stebniskey. Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 328-335, IEEE Computer Society, 1995.

This author has not been identified. It may be one of the following persons:

Alain Frisch

Look up 'A. Frisch' in GoogleThis author has not been identified. Look up 'Mitch Aigner' in GoogleThis author has not been identified. Look up 'T. Almy' in GoogleThis author has not been identified. Look up 'Hans J. Greub' in GoogleThis author has not been identified. Look up 'M. Hazra' in GoogleThis author has not been identified. Look up 'S. Mohr' in GoogleThis author has not been identified. Look up 'Nicholas J. Naclerio' in GoogleThis author has not been identified. Look up 'W. Russell' in GoogleThis author has not been identified. Look up 'M. Stebniskey' in Google

runs on WebDSL