A. Frisch, Mitch Aigner, T. Almy, Hans J. Greub, M. Hazra, S. Mohr, Nicholas J. Naclerio, W. Russell, M. Stebniskey. Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 328-335, IEEE Computer Society, 1995.
Abstract is missing.