Fabio Frustaci, Mahmood Khayatzadeh, David Blaauw, Dennis Sylvester, Massimo Alioto. SRAM for Error-Tolerant Applications With Dynamic Energy-Quality Management in 28 nm CMOS. J. Solid-State Circuits, 50(5):1310-1323, 2015. [doi]
@article{FrustaciKBSA15,
title = {SRAM for Error-Tolerant Applications With Dynamic Energy-Quality Management in 28 nm CMOS},
author = {Fabio Frustaci and Mahmood Khayatzadeh and David Blaauw and Dennis Sylvester and Massimo Alioto},
year = {2015},
doi = {10.1109/JSSC.2015.2408332},
url = {http://dx.doi.org/10.1109/JSSC.2015.2408332},
researchr = {https://researchr.org/publication/FrustaciKBSA15},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {50},
number = {5},
pages = {1310-1323},
}