SRAM for Error-Tolerant Applications With Dynamic Energy-Quality Management in 28 nm CMOS - researchr publication

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Fabio Frustaci, Mahmood Khayatzadeh, David Blaauw, Dennis Sylvester, Massimo Alioto. SRAM for Error-Tolerant Applications With Dynamic Energy-Quality Management in 28 nm CMOS. J. Solid-State Circuits, 50(5):1310-1323, 2015. [doi]

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