Testable Path Selection and Grouping for Faster Than At-Speed Testing

Xiang Fu, Huawei Li, Xiaowei Li 0001. Testable Path Selection and Grouping for Faster Than At-Speed Testing. IEEE Trans. VLSI Syst., 20(2):236-247, 2012. [doi]

Authors

Xiang Fu

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Huawei Li

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Xiaowei Li 0001

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