Xiang Fu, Huawei Li, Xiaowei Li 0001. Testable Path Selection and Grouping for Faster Than At-Speed Testing. IEEE Trans. VLSI Syst., 20(2):236-247, 2012. [doi]
@article{FuLL12,
title = {Testable Path Selection and Grouping for Faster Than At-Speed Testing},
author = {Xiang Fu and Huawei Li and Xiaowei Li 0001},
year = {2012},
doi = {10.1109/TVLSI.2010.2099243},
url = {http://dx.doi.org/10.1109/TVLSI.2010.2099243},
researchr = {https://researchr.org/publication/FuLL12},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {20},
number = {2},
pages = {236-247},
}