Fabric defect detection based on adaptive local binary patterns - researchr publication authors

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Rong Fu, Meihong Shi, Hongli Wei, Huijuan Chen. Fabric defect detection based on adaptive local binary patterns. In IEEE International Conference on Robotics and Biomimetics, ROBIO 2009, December 19-13, 2009, Guilin, Guangxi, China. pages 1336-1340, IEEE, 2009. [doi]

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