Rong Fu, Meihong Shi, Hongli Wei, Huijuan Chen. Fabric defect detection based on adaptive local binary patterns. In IEEE International Conference on Robotics and Biomimetics, ROBIO 2009, December 19-13, 2009, Guilin, Guangxi, China. pages 1336-1340, IEEE, 2009. [doi]
@inproceedings{FuSWC09,
title = {Fabric defect detection based on adaptive local binary patterns},
author = {Rong Fu and Meihong Shi and Hongli Wei and Huijuan Chen},
year = {2009},
doi = {10.1109/ROBIO.2009.5420723},
url = {http://dx.doi.org/10.1109/ROBIO.2009.5420723},
researchr = {https://researchr.org/publication/FuSWC09},
cites = {0},
citedby = {0},
pages = {1336-1340},
booktitle = {IEEE International Conference on Robotics and Biomimetics, ROBIO 2009, December 19-13, 2009, Guilin, Guangxi, China},
publisher = {IEEE},
isbn = {978-1-4244-4774-9},
}