Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG by On-Chip Monitor With Less Recovery Impact - researchr publication authors

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Yarong Fu, Wang Wang, Xin Zhong, Manni Li, Zixu Li, Qing Dong, Yu Jiang, Yinyin Lin. Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG by On-Chip Monitor With Less Recovery Impact. IEEE Trans. Circuits Syst. I Regul. Pap., 69(12):5185-5194, 2022. [doi]

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