Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG by On-Chip Monitor With Less Recovery Impact - researchr publication

researchr

You are not signed in
Sign in
Sign up

Yarong Fu, Wang Wang, Xin Zhong, Manni Li, Zixu Li, Qing Dong, Yu Jiang, Yinyin Lin. Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG by On-Chip Monitor With Less Recovery Impact. IEEE Trans. Circuits Syst. I Regul. Pap., 69(12):5185-5194, 2022. [doi]

Abstract is missing.

runs on WebDSL