Yarong Fu, Wang Wang, Xin Zhong, Manni Li, Zixu Li, Qing Dong, Yu Jiang, Yinyin Lin. Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG by On-Chip Monitor With Less Recovery Impact. IEEE Trans. Circuits Syst. I Regul. Pap., 69(12):5185-5194, 2022. [doi]
@article{FuWZLLDJL22,
title = {Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG by On-Chip Monitor With Less Recovery Impact},
author = {Yarong Fu and Wang Wang and Xin Zhong and Manni Li and Zixu Li and Qing Dong and Yu Jiang and Yinyin Lin},
year = {2022},
doi = {10.1109/TCSI.2022.3206448},
url = {https://doi.org/10.1109/TCSI.2022.3206448},
researchr = {https://researchr.org/publication/FuWZLLDJL22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Circuits Syst. I Regul. Pap.},
volume = {69},
number = {12},
pages = {5185-5194},
}