RESIST: a recursive test pattern generation algorithm for path delay faults - researchr publication authors

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Karl Fuchs, Michael Pabst, Torsten Rössel. RESIST: a recursive test pattern generation algorithm for path delay faults. In Jean Mermet, editor, Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994. pages 316-321, IEEE Computer Society, 1994. [doi]

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