RESIST: a recursive test pattern generation algorithm for path delay faults

Karl Fuchs, Michael Pabst, Torsten Rössel. RESIST: a recursive test pattern generation algorithm for path delay faults. In Jean Mermet, editor, Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994. pages 316-321, IEEE Computer Society, 1994. [doi]

@inproceedings{FuchsPR94,
  title = {RESIST: a recursive test pattern generation algorithm for path delay faults},
  author = {Karl Fuchs and Michael Pabst and Torsten Rössel},
  year = {1994},
  doi = {10.1145/198174.198274},
  url = {http://doi.acm.org/10.1145/198174.198274},
  tags = {testing},
  researchr = {https://researchr.org/publication/FuchsPR94},
  cites = {0},
  citedby = {0},
  pages = {316-321},
  booktitle = {Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994},
  editor = {Jean Mermet},
  publisher = {IEEE Computer Society},
  isbn = {0-89791-685-9},
}